The Holcomb team has discovered a new type of magnetization that is easily switchable, the magnetoelectric dead layer and methods for improving reliability in NASA's next generation single photon detectors. We focus on high quality growth and characterization of thin films exploiting techniques that are ideal for the study of surface and interfacial effects. For example, a powerful technique we utilize is x-ray absorption spectroscopy that allows element specific measurements of atomic valence and magnetization. The element specificity allows the study of multiple material layers and interfaces, also permitting the study of coupling in multilayered materials. We also take advantage of ultrafast optics, primarily pump-probe transient reflectivity.
PO Box 6315
Morgantown, WV 26506
Office:
304-293-5196
Email:
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GROUP MISSION
To understand the physics behind how to harness complexity and/or competition in high quality materials for potential applications
PRIMARY FACILITIES UTILIZED
Pulsed laser deposition with RHEED
Standard sample characterization
Magnetometry
Pump-probe transient reflectivity
Synchrotron radiation techniques (primarily x-ray absorption spectroscopy)