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The Holcomb team has discovered a new type of magnetization that is easily switchable, the magnetoelectric dead layer and methods for improving reliability in NASA's next generation single photon detectors. We focus on high quality growth and characterization of thin films exploiting techniques that are ideal for the study of surface and interfacial effects. For example, a powerful technique we utilize is x-ray absorption spectroscopy that allows element specific measurements of atomic valence and magnetization. The element specificity allows the study of multiple material layers and interfaces, also permitting the study of coupling in multilayered materials. We also take advantage of ultrafast optics, primarily pump-probe transient reflectivity.

 

PO Box 6315

Morgantown, WV 26506

 

Office:

304-293-5196

 

Email: 

mikel.holcomb@mail.wvu.edu

 

Social links:

 

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GROUP MISSION

 

To understand the physics behind how to harness complexity and/or competition in high quality materials for potential applications

PRIMARY FACILITIES UTILIZED

 

Pulsed laser deposition with RHEED

Standard sample characterization

Magnetometry

Pump-probe transient reflectivity

Synchrotron radiation techniques (primarily x-ray absorption spectroscopy)

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